The following publications are possibly variants of this publication:
- Diagnostic test generation for transition faults using a stuck-at ATPG toolYoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu. itc 2009: 1-9 [doi]
- Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test ToolsYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu. ieicet, 91-D(3):690-699, 2008. [doi]