Addressing Defect Coverage through Generating Test Vectors for Transistor Defects - researchr publication authors

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Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu. Addressing Defect Coverage through Generating Test Vectors for Transistor Defects. IEICE Transactions, 92-A(12):3128-3135, 2009. [doi]

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