Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu. Addressing Defect Coverage through Generating Test Vectors for Transistor Defects. IEICE Transactions, 92-A(12):3128-3135, 2009. [doi]
@article{HigamiSTKT09,
title = {Addressing Defect Coverage through Generating Test Vectors for Transistor Defects},
author = {Yoshinobu Higami and Kewal K. Saluja and Hiroshi Takahashi and Shin-ya Kobayashi and Yuzo Takamatsu},
year = {2009},
url = {http://search.ieice.org/bin/summary.php?id=e92-a_12_3128},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/HigamiSTKT09},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {92-A},
number = {12},
pages = {3128-3135},
}