Addressing Defect Coverage through Generating Test Vectors for Transistor Defects

Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu. Addressing Defect Coverage through Generating Test Vectors for Transistor Defects. IEICE Transactions, 92-A(12):3128-3135, 2009. [doi]

Abstract

Abstract is missing.