Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen. A New Approach to Threshold Voltage Measurements of Transistors. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 207-213, IEEE, 2018. [doi]
Abstract is missing.