X-tolerant Test Data Compaction with Accelerated Shift Registers - researchr publication authors

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Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael GÃ¶ssel. X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electronic Testing, 25(4-5):247-258, 2009. [doi]

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