Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel. X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electronic Testing, 25(4-5):247-258, 2009. [doi]
@article{HilscherBRLG09,
title = {X-tolerant Test Data Compaction with Accelerated Shift Registers},
author = {Martin Hilscher and Michael Braun and Michael Richter and Andreas Leininger and Michael Gössel},
year = {2009},
doi = {10.1007/s10836-009-5107-5},
url = {http://dx.doi.org/10.1007/s10836-009-5107-5},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/HilscherBRLG09},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {25},
number = {4-5},
pages = {247-258},
}