Process Modeling for Photoresist Development and Design of DLR/sd (Double-Layer Resist by a Single Development) Process

Yoshihiko Hirai, Masaru Sasago, Masayuki Endo, K. Tsuji, Yojiro Mano. Process Modeling for Photoresist Development and Design of DLR/sd (Double-Layer Resist by a Single Development) Process. IEEE Trans. on CAD of Integrated Circuits and Systems, 6(3):403-409, 1987. [doi]

Abstract

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