A low capture power test generation method using capture safe test vectors

Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai. A low capture power test generation method using capture safe test vectors. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]

Authors

Atsushi Hirai

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Yukari Yamauchi

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Toshinori Hosokawa

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Masayuki Arai

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