Masayuki Hirayama, Tetsuya Yamamoto, Osamu Mizuno, Tohru Kikuno. Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 210-215, IEEE Computer Society, 2003. [doi]
@inproceedings{HirayamaYMK03,
title = {Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers},
author = {Masayuki Hirayama and Tetsuya Yamamoto and Osamu Mizuno and Tohru Kikuno},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510210abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/HirayamaYMK03},
cites = {0},
citedby = {0},
pages = {210-215},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}