Masayuki Hirayama, Tetsuya Yamamoto, Osamu Mizuno, Tohru Kikuno. Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 210-215, IEEE Computer Society, 2003. [doi]
No references recorded for this publication.
No citations of this publication recorded.