A new approach to scan chain reordering using physical design information

Mokhtar Hirech, James Beausang, Xinli Gu. A new approach to scan chain reordering using physical design information. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 348, IEEE Computer Society, 1998. [doi]

Authors

Mokhtar Hirech

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James Beausang

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Xinli Gu

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