A new approach to scan chain reordering using physical design information

Mokhtar Hirech, James Beausang, Xinli Gu. A new approach to scan chain reordering using physical design information. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 348, IEEE Computer Society, 1998. [doi]

@inproceedings{HirechBG98,
  title = {A new approach to scan chain reordering using physical design information},
  author = {Mokhtar Hirech and James Beausang and Xinli Gu},
  year = {1998},
  url = {http://www.computer.org/proceedings/itc/5093/50930348abs.htm},
  tags = {design, systematic-approach},
  researchr = {https://researchr.org/publication/HirechBG98},
  cites = {0},
  citedby = {0},
  pages = {348},
  booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-5093-6},
}