Patterns to Improve Fidelity for Model-Based Testing - researchr publication authors

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Yasuaki Hiruta, Hidetoshi Suhara, Yasuharu Nishi. Patterns to Improve Fidelity for Model-Based Testing. In 15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022. pages 240-243, IEEE, 2022. [doi]

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