Yasuaki Hiruta, Hidetoshi Suhara, Yasuharu Nishi. Patterns to Improve Fidelity for Model-Based Testing. In 15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022. pages 240-243, IEEE, 2022. [doi]
Abstract is missing.