Yasuaki Hiruta, Hidetoshi Suhara, Yasuharu Nishi. Patterns to Improve Fidelity for Model-Based Testing. In 15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022. pages 240-243, IEEE, 2022. [doi]
@inproceedings{HirutaSN22,
title = {Patterns to Improve Fidelity for Model-Based Testing},
author = {Yasuaki Hiruta and Hidetoshi Suhara and Yasuharu Nishi},
year = {2022},
doi = {10.1109/ICSTW55395.2022.00049},
url = {https://doi.org/10.1109/ICSTW55395.2022.00049},
researchr = {https://researchr.org/publication/HirutaSN22},
cites = {0},
citedby = {0},
pages = {240-243},
booktitle = {15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9628-5},
}