Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, A. A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi. Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectronics Reliability, 49(12):1515-1519, 2009. [doi]

This author has not been identified. Look up 'Takayuki Hisaka' in GoogleThis author has not been identified. Look up 'Hajime Sasaki' in GoogleThis author has not been identified. Look up 'Yoichi Nogami' in GoogleThis author has not been identified. Look up 'Kenji Hosogi' in GoogleThis author has not been identified. Look up 'Naohito Yoshida' in GoogleThis author has not been identified. Look up 'A. A. Villanueva' in GoogleThis author has not been identified. Look up 'Jesús A. del Alamo' in GoogleThis author has not been identified. Look up 'Shigehiko Hasegawa' in GoogleThis author has not been identified. Look up 'Hajime Asahi' in Google

runs on WebDSL