Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, A. A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi. Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectronics Reliability, 49(12):1515-1519, 2009. [doi]
Abstract is missing.