Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films - researchr publication authors

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Alexander Hofer, Roland Biberger, Günther Benstetter, Björn Wilke, Holger Göbel. Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films. Microelectronics Reliability, 53(9-11):1430-1433, 2013. [doi]

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