Alexander Hofer, Roland Biberger, Günther Benstetter, Björn Wilke, Holger Göbel. Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films. Microelectronics Reliability, 53(9-11):1430-1433, 2013. [doi]
@article{HoferBBWG13, title = {Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films}, author = {Alexander Hofer and Roland Biberger and Günther Benstetter and Björn Wilke and Holger Göbel}, year = {2013}, doi = {10.1016/j.microrel.2013.07.086}, url = {http://dx.doi.org/10.1016/j.microrel.2013.07.086}, researchr = {https://researchr.org/publication/HoferBBWG13}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {53}, number = {9-11}, pages = {1430-1433}, }