Design as you see FIT: System-level soft error analysis of sequential circuits

Daniel Holcomb, Wenchao Li, Sanjit A. Seshia. Design as you see FIT: System-level soft error analysis of sequential circuits. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 785-790, IEEE, 2009. [doi]

Authors

Daniel Holcomb

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Wenchao Li

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Sanjit A. Seshia

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