Daniel Holcomb, Wenchao Li, Sanjit A. Seshia. Design as you see FIT: System-level soft error analysis of sequential circuits. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 785-790, IEEE, 2009. [doi]
@inproceedings{HolcombLS09,
title = {Design as you see FIT: System-level soft error analysis of sequential circuits},
author = {Daniel Holcomb and Wenchao Li and Sanjit A. Seshia},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090770&count=326&index=156},
tags = {analysis, design},
researchr = {https://researchr.org/publication/HolcombLS09},
cites = {0},
citedby = {0},
pages = {785-790},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}