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Concurrent Error Detection for Restricted Fault Sets in Sequential Circuits and Microprogrammed Control Units Using Convolutional Codes

Lawrence P. Holmquist, Larry L. Kinney. Concurrent Error Detection for Restricted Fault Sets in Sequential Circuits and Microprogrammed Control Units Using Convolutional Codes. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 926-935, IEEE Computer Society, 1991.

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