BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell

Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu. BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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