Katsumi Homma, Izumi Nitta, Toshiyuki Shibuya. Non-Gaussian Statistical Timing models of die-to-die and within-die parameter variations for full chip analysis. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 292-297, IEEE, 2008. [doi]
Abstract is missing.