Design-for-digital-testability 30 MHz second-order Σ-Δ modulator

Hao-Chiao Hong. Design-for-digital-testability 30 MHz second-order Σ-Δ modulator. In Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004. pages 211-214, IEEE, 2004. [doi]

Abstract

Abstract is missing.