Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal Schottky Devices

Shi-Zhe Hong, Shen-Li Chen, Sheng-Kai Fan, Po-Lin Lin, Tien-Yu Lan, Yu-Jie Zhou. Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal Schottky Devices. In 3rd IEEE International Conference on Knowledge Innovation and Invention, ICKII 2020, Kaohsiung, Taiwan, August 21-23, 2020. pages 78-79, IEEE, 2020. [doi]

Abstract

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