An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling - researchr publication

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Dongwoo Hong, Cameron Dryden, Gordon Saksena. An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 123-130, IEEE Computer Society, 2005. [doi]

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