On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up

Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg. On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing, 19(4):369-376, 2003. [doi]

Authors

Camelia Hora

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Rene Segers

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Stefan Eichenberger

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Maurice Lousberg

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