Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg. On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing, 19(4):369-376, 2003. [doi]
@article{HoraSEL03,
title = {On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up},
author = {Camelia Hora and Rene Segers and Stefan Eichenberger and Maurice Lousberg},
year = {2003},
doi = {10.1023/A:1024636424035},
url = {http://dx.doi.org/10.1023/A:1024636424035},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/HoraSEL03},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {19},
number = {4},
pages = {369-376},
}