A realistic fault model for flash memories

Yea-Ling Horng, Jing-Reng Huang, Tsin-Yuan Chang. A realistic fault model for flash memories. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 274-281, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.