Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement - researchr publication

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Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi. Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. IPSJ T. on System LSI Design Methodology, 13:56-64, 2020. [doi]

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