Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara. Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 192, IEEE Computer Society, 1999. [doi]
Abstract is missing.