Toshinori Hosokawa, Ryoichi Inoue, Hideo Fujiwara. Fault-dependent/independent Test Generation Methods for State Observable FSMs. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 275-280, IEEE, 2007. [doi]
@inproceedings{HosokawaIF07,
title = {Fault-dependent/independent Test Generation Methods for State Observable FSMs},
author = {Toshinori Hosokawa and Ryoichi Inoue and Hideo Fujiwara},
year = {2007},
doi = {10.1109/ATS.2007.59},
url = {https://doi.org/10.1109/ATS.2007.59},
researchr = {https://researchr.org/publication/HosokawaIF07},
cites = {0},
citedby = {0},
pages = {275-280},
booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007},
publisher = {IEEE},
isbn = {978-0-7695-2890-8},
}