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Toshinori Hosokawa, Ryoichi Inoue, Hideo Fujiwara. Fault-dependent/independent Test Generation Methods for State Observable FSMs. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 275-280, IEEE, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length ConstraintRyoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara. ieicet, 93-D(1):24-32, 2010. [doi] A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length ConstraintRyoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara. ats 2008: 27-34 [doi] Testing Non-Deterministic State Machines with Fault CoverageSusumu Fujiwara, Gregor von Bochmann. pts 1992: 267-280
The following publications are possibly variants of this publication: