Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara. A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 27-34, IEEE Computer Society, 2008. [doi]
Abstract is missing.