A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification

Toshinori Hosokawa, Morito Niseki, Masayoshi Yoshimura, Hiroshi Yamazaki, Masayuki Arai, Hiroyuki Yotsuyanagi, Masaki Hashizume. A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 43-46, IEEE, 2018. [doi]

Authors

Toshinori Hosokawa

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Morito Niseki

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Masayoshi Yoshimura

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Hiroshi Yamazaki

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Masayuki Arai

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Hiroyuki Yotsuyanagi

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Masaki Hashizume

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