A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification

Toshinori Hosokawa, Morito Niseki, Masayoshi Yoshimura, Hiroshi Yamazaki, Masayuki Arai, Hiroyuki Yotsuyanagi, Masaki Hashizume. A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 43-46, IEEE, 2018. [doi]

@inproceedings{HosokawaNYYAYH18,
  title = {A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification},
  author = {Toshinori Hosokawa and Morito Niseki and Masayoshi Yoshimura and Hiroshi Yamazaki and Masayuki Arai and Hiroyuki Yotsuyanagi and Masaki Hashizume},
  year = {2018},
  doi = {10.1109/IOLTS.2018.8474268},
  url = {https://doi.org/10.1109/IOLTS.2018.8474268},
  researchr = {https://researchr.org/publication/HosokawaNYYAYH18},
  cites = {0},
  citedby = {0},
  pages = {43-46},
  booktitle = {24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018},
  editor = {Dimitris Gizopoulos and Dan Alexandrescu and Mihalis Maniatakos and Panagiota Papavramidou},
  publisher = {IEEE},
  isbn = {978-1-5386-5992-2},
}