A Selective Trigger Scan Architecture for VLSI Testing

Mohammad Hosseinabady, Shervin Sharifi, Fabrizio Lombardi, Zainalabedin Navabi. A Selective Trigger Scan Architecture for VLSI Testing. IEEE Transactions on Computers, 57(3):316-328, 2008. [doi]

Authors

Mohammad Hosseinabady

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Shervin Sharifi

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Fabrizio Lombardi

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Zainalabedin Navabi

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