Mohammad Hosseinabady, Shervin Sharifi, Fabrizio Lombardi, Zainalabedin Navabi. A Selective Trigger Scan Architecture for VLSI Testing. IEEE Transactions on Computers, 57(3):316-328, 2008. [doi]
@article{HosseinabadySLN08,
title = {A Selective Trigger Scan Architecture for VLSI Testing},
author = {Mohammad Hosseinabady and Shervin Sharifi and Fabrizio Lombardi and Zainalabedin Navabi},
year = {2008},
doi = {10.1109/TC.2007.70806},
url = {http://doi.ieeecomputersociety.org/10.1109/TC.2007.70806},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/HosseinabadySLN08},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {57},
number = {3},
pages = {316-328},
}