Kuan-Wei Hou, Hsueh-Hung Cheng, Chi Tung, Cheng-Wen Wu, Juin-Ming Lu. Fault Modeling and Testing of Memristor-Based Spiking Neural Networks. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 92-99, IEEE, 2022. [doi]
Abstract is missing.