Chih-Sheng Hou, Jin-Fu Li. Testing Disturbance Faults in Various NAND Flash Memories. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 221-226, IEEE, 2013. [doi]
@inproceedings{HouL13-2,
title = {Testing Disturbance Faults in Various NAND Flash Memories},
author = {Chih-Sheng Hou and Jin-Fu Li},
year = {2013},
doi = {10.1109/ATS.2013.49},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2013.49},
researchr = {https://researchr.org/publication/HouL13-2},
cites = {0},
citedby = {0},
pages = {221-226},
booktitle = {22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013},
publisher = {IEEE},
}