Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Chih-Sheng Hou, Jin-Fu Li. Testing Disturbance Faults in Various NAND Flash Memories. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 221-226, IEEE, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Disturbance fault testing on various NAND flash memoriesChih-Sheng Hou, Jin-Fu Li. ets 2012: 1 [doi] Testing Disturbance Faults in Various NAND Flash MemoriesChih-Sheng Hou, Jin-Fu Li. et, 30(6):643-652, 2014. [doi]
The following publications are possibly variants of this publication: