Chih-Sheng Hou, Jin-Fu Li, Che-Wei Chou. Test and Repair Scheduling for Built-In Self-Repair RAMs in SOCs. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 3-7, IEEE Computer Society, 2010. [doi]
Abstract is missing.