A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs

Chih-Sheng Hou, Jin-Fu Li, Ting-Jun Fu. A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(12):2020-2024, 2014. [doi]

Abstract

Abstract is missing.