W. Howell, Friedrich Hapke, E. Brazil, S. Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski. DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
@inproceedings{HowellHBVDGRSFR18,
title = {DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies},
author = {W. Howell and Friedrich Hapke and E. Brazil and S. Venkataraman and R. Datta and Andreas Glowatz and Wilfried Redemund and J. Schmerberg and Anja Fast and Janusz Rajski},
year = {2018},
doi = {10.1109/TEST.2018.8624906},
url = {https://doi.org/10.1109/TEST.2018.8624906},
researchr = {https://researchr.org/publication/HowellHBVDGRSFR18},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8382-8},
}