K.-Y. Hsiang, J. Y. Lee, Z.-F. Lou, F. S. Chang, Z. X. Li, C. W. Liu, T.-H. Hou, P. Su, M. H. Lee. Cryogenic Endurance of Anti-ferroelectric and Ferroelectric $\text{Hf}_{1-\mathrm{x}}\text{Zr}_{\mathrm{X}}\mathrm{O}_{2}$ for Quantum Computing Applications. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{HsiangLLCLLHSL23,
title = {Cryogenic Endurance of Anti-ferroelectric and Ferroelectric $\text{Hf}_{1-\mathrm{x}}\text{Zr}_{\mathrm{X}}\mathrm{O}_{2}$ for Quantum Computing Applications},
author = {K.-Y. Hsiang and J. Y. Lee and Z.-F. Lou and F. S. Chang and Z. X. Li and C. W. Liu and T.-H. Hou and P. Su and M. H. Lee},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118311},
url = {https://doi.org/10.1109/IRPS48203.2023.10118311},
researchr = {https://researchr.org/publication/HsiangLLCLLHSL23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}