K.-Y. Hsiang, J. Y. Lee, Z.-F. Lou, F. S. Chang, Z. X. Li, C. W. Liu, T.-H. Hou, P. Su, M. H. Lee. Cryogenic Endurance of Anti-ferroelectric and Ferroelectric $\text{Hf}_{1-\mathrm{x}}\text{Zr}_{\mathrm{X}}\mathrm{O}_{2}$ for Quantum Computing Applications. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.