Michael S. Hsiao, Mainak Banga. Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 225-230, IEEE Computer Society, 2009. [doi]
Abstract is missing.