Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh. Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 276-285, IEEE, 2023. [doi]
Abstract is missing.